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What We Have Learned About Fighting Defects.

Forrest ShullVictor R. BasiliBarry W. BoehmA. Winsor BrownPatricia CostaMikael LindvallDaniel PortIoana RusRoseanne TesorieroMarvin V. Zelkowitz
Published in: IEEE METRICS (2002)
Keyphrases
  • defect detection
  • neural network
  • information systems
  • database
  • similarity measure
  • recommender systems
  • significant improvement
  • current status
  • unsupervised manner