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Full-Swing Local Bitline SRAM Architecture Based on the 22-nm FinFET Technology for Low-Voltage Operation.
Kyoman Kang
Hanwool Jeong
Younghwi Yang
Juhyun Park
Ki-Ryong Kim
Seong-Ook Jung
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
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cmos technology
low voltage
low power
power consumption
random access memory
leakage current
parallel processing
embedded dram
power line
power dissipation
silicon on insulator
design considerations
low cost
high speed
image sensor
nm technology
real time
data flow