Failure Mitigation Techniques for 1T-1MTJ Spin-Transfer Torque MRAM Bit-cells.
Xuanyao FongYusung KimSri Harsha ChodayKaushik RoyPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2014)
Keyphrases
- random access memory
- design considerations
- low voltage
- failure prediction
- control algorithm
- eddy current
- knowledge transfer
- failure detection
- room temperature
- induction motor
- stem cell
- real time
- bit vector
- success or failure
- block cipher
- cell nuclei
- failure rate
- cross domain
- control scheme
- transfer learning
- high speed
- machine learning
- data sets