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Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs.
Mohamed Tagelsir Mohammadat
Noohul Basheer Zain Ali
Fawnizu Azmadi Hussin
Mark Zwolinski
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
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low power
power consumption
high speed
low cost
test cases
single chip
vlsi circuits