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A defective level monitor of open defects in 3D ICs with a comparator of offset cancellation type.
Michiya Kanda
Masaki Hashizume
Hiroyuki Yotsuyanagi
Shyue-Kung Lu
Published in:
DFT (2017)
Keyphrases
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real time
special case
higher level
neural network
clustering algorithm
case study
high level
face recognition
cooperative
relational databases
evolutionary algorithm
multiresolution
monitoring system
pixel level
levels of abstraction