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Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology.

H. ZhangH. JiangM. R. EakerK. J. LezonBalaji NarasimhamNihaar N. MahatmeLloyd W. MassengillBharat L. Bhuva
Published in: IRPS (2018)
Keyphrases
  • computer systems
  • cmos technology
  • case study
  • data model
  • image restoration