On-wafer BIST of a 200-Gb/s failed-bit search for 1-Gb DRAM.

Satoru Tanoi Yasuhiro Tokunaga Tetsuya Tanabe Kazuhiko Takahashi Atsuhiko Okada Masahiro Itoh Yoshiki Nagatomo Yoshio Ohtsuki Masaru Uesugi

Published in: IEEE J. Solid State Circuits (1997)

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