Noise and reliability in simulated thin metal films.
Stefano Di PascoliGiuseppe IannacconePublished in: Microelectron. Reliab. (2008)
Keyphrases
- grain size
- noisy data
- image noise
- missing data
- noise level
- additive noise
- signal to noise ratio
- noise reduction
- highly reliable
- random noise
- low snr
- sensor noise
- median filter
- chemical vapor deposition
- information systems
- noise sensitivity
- film restoration
- noise model
- arbitrary shape
- spatial distribution
- simulation model
- image sequences
- case study