Login / Signup

Analysis of the Equivalences and Dominances of Transient Faults at the RT Level.

Luis BerrojoIsabel GonzálezLuis EntrenaCelia LópezFulvio CornoMatteo Sonza ReordaGiovanni Squillero
Published in: IOLTW (2002)
Keyphrases
  • data structure
  • statistical analysis
  • machine learning
  • information retrieval
  • bayesian networks
  • low level
  • markov chain
  • test cases