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Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs.
Hisayoshi Hanai
Shinji Yamada
Hisaya Mori
Eisaku Yamashita
Teruhiko Funakura
Published in:
Asian Test Symposium (2001)
Keyphrases
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genetic algorithm
low cost
constraint satisfaction problems
test cases
statistical tests