• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

Generation of Hot-Carrier Induced Border and Interface Traps, Investigated by Spectroscopic Charge Pumping.

Bernhard RuchGregor PobegenChristian SchleichTibor Grasser
Published in: IRPS (2020)
Keyphrases