Adjacency-Clustering and Its Application for Yield Prediction in Integrated Circuit Manufacturing.
Dorit S. HochbaumSheng LiuPublished in: Oper. Res. (2018)
Keyphrases
- integrated circuit
- prediction accuracy
- clustering algorithm
- printed circuit boards
- k means
- clustering method
- predictive clustering trees
- data clustering
- unsupervised learning
- hardware description language
- fuzzy clustering
- categorical data
- electron beam
- information theoretic
- cluster analysis
- hierarchical clustering
- prediction model
- manufacturing systems
- quality control
- data points
- image processing
- video sequences
- prediction algorithm
- spectral clustering
- self organizing maps