Flash Memory Die Sort by a Sample Classification Method.
Yu-Chun DawnJen-Chieh YehCheng-Wen WuChia-Ching WangYung-Chen LinChao-Hsun ChenPublished in: Asian Test Symposium (2005)
Keyphrases
- classification method
- flash memory
- solid state
- garbage collection
- main memory
- file system
- disk drives
- knn
- test sample
- random access
- support vector machine
- k nearest neighbor
- embedded systems
- text classification
- data storage
- support vector machine svm
- classification algorithm
- hand held devices
- b tree
- database systems
- storage systems
- data model
- storage devices
- image processing
- learning algorithm
- nearest neighbor
- query processing
- small size
- association rules
- data structure
- data mining
- neural network