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SLAM: SLice And Merge - Effective Test Generation for Large Systems.

Tali RabettiRonny MoradAlex GoryachevWisam KadryRichard D. Peterson
Published in: Haifa Verification Conference (2013)
Keyphrases
  • test generation
  • design automation
  • high quality
  • data sets
  • complex systems
  • metadata
  • image processing
  • high level
  • open source