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Very Low Voltage Testing of SOI Integrated Circuits.

Eric MacDonaldNur A. Touba
Published in: VTS (2002)
Keyphrases
  • integrated circuit
  • low voltage
  • power line
  • design considerations
  • power management
  • electron beam
  • printed circuit boards
  • cmos technology
  • hardware description language
  • real time
  • moving objects
  • high speed