Login / Signup
Implications of electron beam irradiation on Al/n-Si Schottky junction properties.
Indudhar Panduranga Vali
Pramoda Kumara Shetty
M. G. Mahesha
V. C. Petwal
Jishnu Dwivedi
D. M. Phase
R. J. Choudhary
Published in:
Microelectron. Reliab. (2018)
Keyphrases
</>
electron beam
integrated circuit
x ray
design parameters
semiconductor devices
neural network