Login / Signup

Implications of electron beam irradiation on Al/n-Si Schottky junction properties.

Indudhar Panduranga ValiPramoda Kumara ShettyM. G. MaheshaV. C. PetwalJishnu DwivediD. M. PhaseR. J. Choudhary
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • electron beam
  • integrated circuit
  • x ray
  • design parameters
  • semiconductor devices
  • neural network