Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86].
Qing ZhangYuhang ZhangJizuo LiYongfu LiPublished in: Integr. (2023)
Keyphrases
- pattern classification
- neural network
- pattern recognition
- probabilistic neural network
- feature extraction
- nearest neighbor rule
- fuzzy classifier
- radial basis function neural network
- pattern classification problems
- vowel recognition
- human identification
- fuzzy logic
- fault diagnosis
- decision boundary
- back propagation
- feature vectors
- high dimensional
- image processing
- computer vision