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An Approach to Improve the Resolution of Defect-Based Diagnosis.

Iwao YamazakiHiroki YamanakaToshio IkedaMasahiro TakakuraYasuo Sato
Published in: Asian Test Symposium (2001)
Keyphrases
  • data sets
  • database
  • databases
  • machine learning
  • bayesian networks
  • high resolution
  • wireless sensor networks
  • fuzzy logic
  • image quality
  • model based reasoning
  • attention deficit hyperactivity disorder