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Local stress analysis on semiconductor devices by combined experimental-numerical procedure.
Rene Kregting
Sander Gielen
Willem D. van Driel
Paul Alkemade
Hozan Miro
Jan-Dirk Kamminga
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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numerical analysis
real world
statistical analysis
data sets
data analysis
electron beam
artificial neural networks
image analysis