A built-in self test scheme for VLSI.

T. Raju Damarla Wei Su Gerald T. Michael Moon J. Chung Charles E. Stroud

Published in: ASP-DAC (1995)

Keyphrases

vlsi implementation
signal processing
vlsi design
pattern recognition
detection scheme
artificial intelligence
real world
classification scheme
representation scheme
optimization scheme
polynomial time approximation
built in self test