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Automating Stressmark Generation for Testing Processor Voltage Fluctuations.
Youngtaek Kim
Lizy Kurian John
Sanjay Pant
Srilatha Manne
Michael J. Schulte
William Lloyd Bircher
Madhu Saravana Sibi Govindan
Published in:
IEEE Micro (2013)
Keyphrases
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power system
high speed
test cases
parallel processing
single chip
generation process
software testing
duty cycle
low voltage
electric field
single processor
power supply
computer architecture
database
information systems
genetic algorithm
neural network