Memristive CNN for Wafer defect detection.

R. Chithra A. R. Aswani A. P. James

Published in: ISCAS (2022)

Keyphrases

defect detection
cellular neural networks
semiconductor manufacturing
integrated circuit
convolutional neural network
feature extraction
massively parallel
automated visual inspection
textured surfaces
neural network
genetic algorithm
wafer fabrication
data sets
data mining
natural images
centroid neural network