Sign in

and 749-1, 459 TOPS/W in 28nm.

Viveka Konandur RajannaSachin TanejaMassimo Alioto
Published in: ESSDERC (2021)
Keyphrases
  • real time
  • data sets
  • learning algorithm
  • high speed
  • pattern recognition
  • mobile devices
  • image analysis
  • transmission electron microscopy