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System Level Benchmarking with Yield-Enhanced Standard Cell Library for Carbon Nanotube VLSI Circuits.

Shashikanth BobbaJie ZhangPierre-Emmanuel GaillardonH.-S. Philip WongSubhasish MitraGiovanni De Micheli
Published in: ACM J. Emerg. Technol. Comput. Syst. (2014)
Keyphrases
  • vlsi circuits
  • higher level
  • digital images
  • image processing
  • image analysis
  • high speed
  • low power
  • parallel computing
  • mixed signal