Boosting chipkill capability under retention-error induced reliability emergency.
Xianwei ZhangRujia WangYoutao ZhangJun YangPublished in: ASP-DAC (2019)
Keyphrases
- error detection
- error rate
- failure rate
- long term
- training error
- learning algorithm
- error bounds
- combining multiple
- emergency response
- decision making
- feature selection
- management system
- base classifiers
- generalization error
- error analysis
- machine learning
- decision support
- model selection
- boosting algorithms
- data mining
- neural network