A Built-in Method to Repair SoC RAMs in Parallel.
Tsu-Wei TsengJin-Fu LiChih-Sheng HouPublished in: IEEE Des. Test Comput. (2010)
Keyphrases
- preprocessing
- pairwise
- significant improvement
- synthetic data
- high accuracy
- database systems
- classification method
- clustering method
- detection algorithm
- theoretical analysis
- high precision
- detection method
- computationally efficient
- low cost
- computational cost
- learning algorithm
- optimization algorithm
- support vector machine
- probabilistic model
- mathematical model
- matching algorithm
- experimental evaluation
- low power
- parallel implementation