In Situ SRAM Static Stability Estimation in 65-nm CMOS.

Henry Park Chih-Kong Ken Yang

Published in: IEEE J. Solid State Circuits (2013)

Keyphrases

power consumption
cmos technology
low power
random access memory
nm technology
estimation accuracy
low voltage
low cost
density estimation
leakage current
real time
high speed
power supply
power reduction
metal oxide semiconductor