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Radiation Hardened Flip-Flops with low Area, Delay and Power Overheads in a 65 nm bulk process.

Shotaro SugitaniRyuichi NakajimaKeita YoshidaJun FurutaKazutoshi Kobayashi
Published in: IRPS (2023)
Keyphrases
  • power consumption
  • power dissipation
  • neural network
  • image processing
  • infrared
  • input output
  • cmos technology