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In-Situ Testing of the Thermal Diffusivity of Polysilicon Thin Films.

Yifan GuZai-Fa ZhouChao SunWei-Hua LiQing-An Huang
Published in: Micromachines (2016)
Keyphrases
  • thin film
  • room temperature
  • random access memory
  • grain size
  • multi layer
  • high density
  • short circuit
  • solar cell
  • neural network
  • query processing
  • film thickness