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Design for Debug: Catching Design Errors in Digital Chips.

Bart VermeulenSandeep Kumar Goel
Published in: IEEE Des. Test Comput. (2002)
Keyphrases
  • circuit design
  • artificial intelligence
  • information systems
  • knowledge base
  • case study
  • database
  • image processing
  • user interface
  • design process
  • high density
  • design space