An FPGA-based re-configurable functional tester for memory chips.
Jing-Reng HuangChee-Kian OngKwang-Ting ChengCheng-Wen WuPublished in: Asian Test Symposium (2000)
Keyphrases
- digital signal processors
- integrated circuit
- low memory
- memory usage
- data sets
- functional units
- memory space
- application specific
- black box
- memory requirements
- high speed
- hardware implementation
- general purpose
- high density
- neural network
- computing power
- field programmable gate array
- artificial neural networks
- functional analysis
- hardware design
- limited memory
- past experience
- random access
- case study
- real time
- signal processing
- embedded systems