Login / Signup

Reliability-centric gate sizing with simultaneous optimization of soft error rate, delay and power.

Koustav BhattacharyaNagarajan Ranganathan
Published in: ISLPED (2008)
Keyphrases
  • error rate
  • simultaneous optimization
  • test set
  • power losses
  • power consumption
  • lower error rates
  • network reliability
  • rule sets
  • training error
  • cost sensitive classification
  • data sets
  • machine learning