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Maximizing Stuck-Open Fault Coverage Using Stuck-at Test Vectors.

Yoshinobu HigamiKewal K. SalujaHiroshi TakahashiShin-ya KobayashiYuzo Takamatsu
Published in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2008)
Keyphrases
  • artificial intelligence
  • feature vectors
  • test data
  • metadata
  • decision trees
  • case study
  • input data