Reducing Test Application Time for Built-in-Self-Test Test Pattern Generators.
Ilker HamzaogluJanak H. PatelPublished in: VTS (2000)
Keyphrases
- built in self test
- statistical significance
- test data
- multiresolution
- machine learning
- relational databases
- conducted an empirical study
- software development
- object oriented
- artificial neural networks
- preprocessing
- search algorithm
- wide range
- three dimensional
- knowledge base
- e learning
- artificial intelligence
- information retrieval