Login / Signup

Investigation of proton irradiated dual field plate AlGaN/GaN HEMTs: TCAD based assessment.

NehaVandana KumariMridula GuptaManoj Saxena
Published in: Microelectron. J. (2022)
Keyphrases
  • computer vision
  • data sets
  • databases
  • multiscale
  • quality assessment
  • computer aided design