Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design.
Antonis PapanikolaouMiguel MirandaHua WangFrancky CatthoorM. SatyakiranPol MarchalBen KaczerC. BruynseraedeZsolt TokeiPublished in: VLSI-SoC (2006)