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Reliability studies of vertical GaN devices based on bulk GaN substrates.
Isik C. Kizilyalli
P. Bui-Quang
Don Disney
H. Bhatia
Ozgur Aktas
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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reliability assessment
structuring elements
information systems
empirical studies
binary images
artificial intelligence
mobile devices
gray scale
mathematical morphology
literature review