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18.4 An 1.1V 68.2GB/s 8Gb Wide-IO2 DRAM with non-contact microbump I/O test scheme.

Young Jun YoonByung Deuk JeonByung Soo KimKi Up KimTae Yong LeeNohhyup KwakWoo-Yeol ShinNa Yeon KimYunseok HongKyeong Pil KangDong Yoon KaSeong Ju LeeYong Sun KimYoung Kyu NohJaehoon KimDong Keum KangHo Uk SongHyeon Gon KimJonghoon Oh
Published in: ISSCC (2016)
Keyphrases
  • main memory
  • high speed
  • wide range
  • detection scheme
  • database management systems
  • data sets
  • neural network
  • test cases
  • input output
  • classification scheme
  • high density
  • garbage collection