Detection and classification of material attributes-a practical application of wavelet analysis.
Peter MaassGerd TeschkeWerner WillmannGünter WollmannPublished in: IEEE Trans. Signal Process. (2000)
Keyphrases
- practical application
- wavelet analysis
- wavelet transform
- pattern recognition
- feature vectors
- feature detection
- support vector machine svm
- multiresolution
- support vector
- training set
- feature extraction
- feature selection
- detection algorithm
- data mining
- mexican hat
- neural network
- machine learning methods
- text classification
- support vector machine
- feature space
- unsupervised learning
- model selection
- basis functions
- low frequency
- image processing
- wavelet neural network
- wavelet basis
- computer vision