Pattern classification by using improved wavelet Compressed Zernike Moments.
George A. PapakostasYiannis S. BoutalisDimitris A. KarrasBasil G. MertziosPublished in: Appl. Math. Comput. (2009)
Keyphrases
- pattern classification
- zernike moments
- feature extraction
- pattern recognition
- image reconstruction
- rotation invariant
- feature vectors
- wavelet transform
- shape descriptors
- basis functions
- moment invariants
- fourier descriptors
- high order
- invariant features
- pseudo zernike moments
- multiscale
- affine invariant
- image representation
- three dimensional
- denoising
- small number
- polar coordinates
- high quality