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Modeling avalanche breakdown for ESD diodes in integrated circuits.

Camillo StefanucciPietro BuccellaMaher KayalJean-Michel Sallese
Published in: DTIS (2015)
Keyphrases
  • integrated circuit
  • modeling method
  • machine learning
  • database systems
  • data sets
  • neural network
  • learning algorithm
  • image processing
  • decision trees
  • high density