Significance of activation functions in developing an online classifier for semiconductor defect detection.
Md Meftahul FerdausBangjian ZhouJi Wei YoonKain Lu LowJieming PanJoydeep GhoshMin WuXiaoli LiAaron Voon-Yew TheanJ. SenthilnathPublished in: Knowl. Based Syst. (2022)
Keyphrases
- defect detection
- activation function
- neural network
- neural architecture
- support vector
- artificial neural networks
- feature extraction
- hidden layer
- feed forward
- back propagation
- feature space
- training data
- decision trees
- feed forward neural networks
- multi layer perceptron
- radial basis function
- machine learning
- pattern recognition
- training examples
- training samples
- recurrent neural networks
- neural nets
- particle swarm optimization
- training phase
- support vector machine
- training set
- multiple classifiers
- image processing
- hidden nodes
- computer vision