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Design considerations and strategies for high-reliable STT-MRAM.
Weisheng Zhao
Thibaut Devolder
Yahya Lakys
Jacques-Olivier Klein
Claude Chappert
Pascale Mazoyer
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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design considerations
random access memory
machine learning
high reliability
low voltage
wide range
real time
neural network
e learning
cost effective
high precision
pedagogical agents