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Broadside and Functional Broadside Tests for Partial-Scan Circuits.

Irith PomeranzSudhakar M. Reddy
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
  • high speed
  • data mining
  • computer vision
  • genetic algorithm
  • vlsi circuits
  • databases
  • neural network
  • real world
  • test data
  • functional properties
  • scan data
  • high level synthesis