Durchgängiger Einsatz Hardware-unabhängiger Testfälle im MiL-, SiL- und HiL-Test.
Michael MüllerPublished in: Softwaretechnik-Trends (2008)
Keyphrases
- low cost
- hardware and software
- real time
- multiple instance learning
- high dimensional
- dimensionality reduction
- computer systems
- high dimensional data
- test data
- field programmable gate array
- statistical tests
- manifold learning
- supervised learning
- data sets
- embedded systems
- pattern recognition
- face recognition
- massively parallel