Login / Signup

Total ionizing dose radiation effect on the threshold voltage for the uniaxial strained Si nano NMOSFET.

Minru HaoHuiyong HuChen-Guang LiaoHaiyan KangHan SuQian ZhangYingbo Zhao
Published in: IEICE Electron. Express (2017)
Keyphrases
  • small animal
  • infrared
  • metal oxide
  • x ray
  • threshold selection
  • atomic force microscopy
  • radiation doses
  • real time
  • electric field
  • treatment plan
  • nano scale