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An effective test methodology enabling detection of weak bits in SRAMs: Case study in 28nm FDSOI.
Nidhi Batra
Anil Kumar Gundu
Mohammad S. Hashmi
G. S. Visweswaran
Anuj Grover
Published in:
VDAT (2016)
Keyphrases
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case study
computationally efficient
detection algorithm
data sets
statistical significance
real time
learning algorithm
artificial intelligence
knowledge base
multiscale
low cost
detection method
face detection
detection rate
detection accuracy