A concurrent testing method for NoC switches.
Mohammad HosseinabadyAbbas BanaiyanMahdi Nazm BojnordiZainalabedin NavabiPublished in: DATE (2006)
Keyphrases
- high precision
- cost function
- high accuracy
- objective function
- computational cost
- pairwise
- dynamic programming
- clustering method
- data sets
- significant improvement
- classification method
- artificial neural networks
- computational complexity
- image segmentation
- fully automatic
- error rate
- theoretical analysis
- segmentation method
- synthetic data
- classification accuracy
- detection method
- medical images
- denoising
- support vector machine
- prior knowledge
- preprocessing
- image processing