Built-in Self-test Technique for Selective Detection of Neighbourhood Pattern Sensitive Faults in Memories.
Rajeshwar S. SableRavindra P. SarafRubin A. ParekhjiArun N. ChandorkarPublished in: VLSI Design (2004)
Keyphrases
- built in self test
- associative memory
- pattern detection
- integrated circuit
- automatic detection
- pattern matching
- false positives
- object detection
- detection method
- detection algorithm
- databases
- hidden markov models
- event detection
- artificial neural networks
- case study
- website
- detection accuracy
- automated detection
- knowledge base
- data mining