A Deep convolutional neural network with residual blocks for wafer map defect pattern recognition.
Fu-Kwun WangJia-Hong ChouZemenu Endalamaw AmognePublished in: Qual. Reliab. Eng. Int. (2022)
Keyphrases
- convolutional neural network
- pattern recognition
- face detection
- neural network
- image analysis
- signal processing
- image processing
- machine learning
- pattern classification
- multi class
- pattern recognition problems
- pattern analysis
- feature extraction
- data mining
- maximum a posteriori
- computer vision
- variable size
- semiconductor manufacturing
- data sets
- decision trees
- feature selection
- deep learning
- wafer fabrication